Coupled electro-magnetic field & Lorentz force effects in silicon and metal for ESD investigation in transient and harmonic regimes

نویسندگان

  • Philippe Galy
  • Wim Schoenmaker
چکیده

Article history: Received 29 May 2015 Received in revised form 15 June 2015 Accepted 15 June 2015 Available online 15 July 2015

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عنوان ژورنال:
  • Microelectronics Reliability

دوره 55  شماره 

صفحات  -

تاریخ انتشار 2015